The effect of nanoscale roughness on long range interaction forces

Journal of Nanoparticle Research

Volumn 1, Issue 1, 1999, Pages 99-113

  Walz, John Y ^a   Suresh, Lakkapragada ^a,b   Piech, Martin ^a  

^a Yale University   (United States)

^b Arizona State University   (United States)

Author keywords

Colloidal particles; Electrostatic energy; Particle wall interaction; Total internal reflection microscopy (TIRM); Van der waals force

Indexed keywords

EID: 0347786586     PISSN: 13880764     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1010065714589     Document Type: Article

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