Preparation of SnS2 thin films by close-spaced sublimation at different source temperatures

Thin Solid Films

Volumn 534, Issue , 2013, Pages 28-31

  Shi, Chengwu ^a,b   Yang, Pengfei ^a,b   Yao, Min ^a,b   Dai, Xiaoyan ^a,b   Chen, Zhu ^a,b  

^a HEFEI UNIVERSITY OF TECHNOLOGY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Close spaced sublimation; Source temperature; Thin film; Tin sulfide

Indexed keywords

CLOSE SPACED SUBLIMATION; ENERGY DISPERSIVE X RAY SPECTROSCOPY; PREFERRED ORIENTATIONS; SCANNING ELECTRON MICROSCOPE; SOURCE TEMPERATURE; THIN-FILM DEPOSITION TECHNIQUE; TIN SULFIDE; ULTRAVIOLET-VISIBLE ABSORPTION SPECTRUM;

OPTICAL BAND GAPS; OPTIMIZATION; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; SUBLIMATION; SULFUR COMPOUNDS; THIN FILMS; TIN; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

FILM PREPARATION;

EID: 84876686213     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2013.01.072     Document Type: Article

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