Characterization of 2-D reflection pattern from textured front surfaces of silicon solar cells

Solar Energy Materials and Solar Cells

Volumn 115, Issue , 2013, Pages 42-51

  Yang, Y ^a   Green, M A ^a   Ho Baillie, A ^a   Kampwerth, H ^a   Pillai, S ^a   Mehrvarz, H ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Encapsulant; Optical setup; Reflected light distribution; Refractive index; Total internal reflection

Indexed keywords

ENCAPSULANTS; FABRICATION PROCESS; MAXIMUM INTENSITIES; OPTICAL SET-UP; REFLECTED LIGHT; REFLECTION PATTERNS; SURFACE GEOMETRIES; TOTAL INTERNAL REFLECTIONS;

DIFFRACTION PATTERNS; GEOMETRICAL OPTICS; INTERFEROMETRY; REFRACTIVE INDEX; SILICON SOLAR CELLS;

TWO DIMENSIONAL;

EID: 84876579783     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2013.03.026     Document Type: Article

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