A new approach to the analysis of light collected by textured silicon surfaces

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn A, Issue , 2003, Pages 122-125

  Parretta, A ^a   Bobeico, E ^a   Lancellotti, L ^a   Morvillo, P ^a   Wang, A ^b   Zhao, J ^b  

^a ENEA CR Portici   (Italy)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT BACKSCATTERING; LIGHT INTENSITY; SURFACE TEXTURES; TEXTURED SILICON SURFACES;

ASPECT RATIO; CRYSTAL LATTICES; CRYSTALLINE MATERIALS; DATA REDUCTION; ELECTROMAGNETIC WAVE BACKSCATTERING; HONEYCOMB STRUCTURES; LASER BEAMS; LIGHT ABSORPTION; LIGHT SCATTERING;

POROUS SILICON;

EID: 6344243434     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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