Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1997, Pages 187-190

  Pla, J C ^a   Duran, J C ^a   Skigin, D C ^a   Depine, R A ^a  

^a DEPARTAMENTO DE FÍSICA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD EFFECTS; ELECTROMAGNETISM; MULTILAYERS; OPTICS; SOLAR CELLS; SURFACE STRUCTURE;

ANTIREFLECTIVE TEXTURED SURFACES; RAY OPTICS; RAY TRACING;

PHOTOVOLTAIC CELLS;

EID: 0031344562     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)