Random pyramidal texture modelling

Solar Energy Materials and Solar Cells

Volumn 45, Issue 3, 1997, Pages 241-253

  Rodriguez J M ^a   Tobias I ^a   Luque, A ^a  

^a INSTITUTO DE ENERGÍA SOLAR   (Spain)

Author keywords

Lighr confinement; Pyramidal texture; Ray tracing; Reflectance

Indexed keywords

LIGHT; LIGHT ABSORPTION; SILICON WAFERS; SIMULATION;

PERIODIC TEXTURE; RANDOM PYRAMIDAL TEXTURE MODELLING; RAY TRACING; REFLECTIVITY;

SOLAR CELLS;

EID: 0041544089     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(96)00040-2     Document Type: Article

References (5)

1. A.W. Smith, A. Rohatgi and S.C. Neel, TEXTURE: A ray tracing program for the photovoltaic community, User Handbook, Georgia Institute of Technology, Atlanta, March 1992.
2. R. Brendel, SUNRAYS: A versatile ray tracing program for the photovoltaic community, User Handbook, presented at the 12th European Photovoltaic Solar Energy Conf., Amsterdam, April 1994.
3. D.L. King and M.E. Buck, Experimental optimization of an anisotropic etching process for random texturization of silicon solar cells, Proc. 21th Photovoltaic Specialists Conf., 1991, pp. 303-308.
4. J.M. Rodríguez, Estudio de las propiedades ópticas de las obleas texturadas de silicio, Proyecto Fin de Carrera, Curso 1993-94, E.T.S.I. Telecomunicación, Universidad Politécnica de Madrid.
5. I. Tobías, J.M. Rodríguez and A. Luque, Experimental extraction of light confinement parameters for textured silicon wafers, Prog. Photovoltaics 3 (1995) 177-187.