Reconstruction of the surface topography of randomly textured silicon

Progress in Photovoltaics: Research and Applications

Volumn 11, Issue 2, 2003, Pages 89-95

  Kuchler, Gregor ^a   Brendel, Rolf ^a  

^a BAVARIAN CENTER FOR APPLIED ENERGY RESEARCH ZAE BAYERN   (Germany)

Author keywords

Anisotropic etching; Characterisation; Random pyramids; Silicon; Stereoscopic; Surface topography; Texture; Thin film

Indexed keywords

ETCHING; SCANNING ELECTRON MICROSCOPY; SPECIAL EFFECTS; SURFACE STRUCTURE; TEXTURES; THIN FILMS;

ANISOTROPIC ETCHING; SURFACE TOPOGRAPHY;

SILICON WAFERS;

EID: 0037339987     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.463     Document Type: Article

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3. Klette R, Koschan A, Schlüns K. Computer Vision. Vieweg: Braunschweig, 1996.
4. Sonka M, Hlavac V, Boyle R. Image Processing, Analysis and Machine Vision. Chapman & Hall: London, 1993.
5. Software MEX, Alicona Imaging GmbH, Parkring 2, A-8074 Grambach, Austria.