Comparison between FTIR and XPS characterization of amino acid glycine adsorption onto diamond-like carbon (DLC) and silicon doped DLC

Applied Surface Science

Volumn 273, Issue , 2013, Pages 507-514

  Ahmed, Mukhtar H ^a   Byrne, John A ^a   McLaughlin, J A D ^a   Elhissi, Abdelbary ^b   Ahmed, Waqar ^b  

^a UNIVERSITY OF ULSTER   (United Kingdom)

^b UNIVERSITY OF CENTRAL LANCASHIRE   (United Kingdom)

Author keywords

FTIR; Glycine adsorption; Silicon doped diamond like carbon Si DLC; Spectroscopic ellipsometry; XPS

Indexed keywords

ADSORPTION; AMINO ACIDS; BIOCOMPATIBILITY; CHEMICAL ANALYSIS; DIAMONDS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTOR DOPING; SILICON WAFERS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ANALYSIS;

BIOCOMPATIBLE SURFACES; DIAMOND-LIKE CARBON COATINGS; DOPED DIAMOND-LIKE CARBON; FOURIER TRANSFORM INFRARED SPECTRUMS; FTIR; PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITIONS (PECVD); SILICON WAFER SUBSTRATES; SURFACE ANALYSIS TECHNIQUES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84876413283     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.02.070     Document Type: Article

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