Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy

Materials Characterization

Volumn 48, Issue 2-3, 2002, Pages 205-210

  Luo, E Z ^a   Lin, S ^a   Xie, Z ^a   Xu, J B ^a   Wilson, I H ^a   Yu, Y H ^b   Yu, L J ^b   Wang, X ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

Conducting atomic force; Microscopy; Ta carbon films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; DEPOSITION; ELECTRIC CONDUCTANCE; ELECTRON TRANSPORT PROPERTIES; MORPHOLOGY; SUBSTRATES; THIN FILMS;

CARBON THIN FILMS;

AMORPHOUS FILMS;

EID: 0036526373     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(02)00240-1     Document Type: Conference Paper

References (14)

1. Hard amorphous (diamond-like) carbons
2. Field-dependence of area-density of "cold" electron emission sites on broad-area CVD diamond films
3. Growth, microstructure and electronic properties of amorphous carbon nitride films investigated by plasma diagnostics
4. Defects, doping and conduction mechanisms in nitrogen-doped tetrahedral amorphous carbon
5. 2-phase nanostructure on field emission from amorphous carbons
6. Photoconductivity and electronic transport in tetrahedral amorphous carbon and hydrogenated tetrahedral amorphous carbon
7. Hydrogen-free amorphous carbon preparation and properties
8. Field emission conduction mechanisms in chemical vapor deposited diamond and diamondlike carbon films
9. Probing the conducting paths in a metal-insulator composite by conducting atomic force microscopy
10. Probing electron conduction at the microscopic level in percolating nanocomposites by conducting atomic-force microscopy
11. Optical and electrical properties of nitrogen incorporated amorphous carbon films
12. Identifying conducting phase from insulating matrix in percolating nanocomposites by conducting atomic force microscopy
13. Nanostructural conductivity and surface-potential study of low-field emission carbon films with conductive scanning probe microscopy