The surface of nanoparticle silicon as studied by solid-state NMR

Materials

Volumn 6, Issue 1, 2013, Pages 18-46

  Faulkner, Rebecca A ^a   DiVerdi, Joseph A ^a   Yang, Yuan ^a,b   Kobayashi, Takeshi ^a,c   Maciel, Gary E ^a  

^a Department of Environmental and Radiological Health Sciences   (United States)

^b Department of Geology and Geological Engineering   (United States)

^c IOWA STATE UNIVERSITY   (United States)

Author keywords

29Si NMR; Nanoparticles; Silicon; Solid state NMR; Surface characterization

Indexed keywords

29SI NMR; BACKGROUND SUPPRESSION; CHEMICAL TREATMENTS; ELEVATED TEMPERATURE; RELAXATION PARAMETER; SOLID STATE NMR; SOLID-STATE NMR SPECTROSCOPY; SURFACE CHARACTERIZATION;

ATOMS; CHEMICAL BONDS; MAGIC ANGLE SPINNING; NANOPARTICLES; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; QUANTUM THEORY; SOLID STATE PHYSICS; SURFACE STRUCTURE;

SILICON;

EID: 84875802781     PISSN: None     EISSN: 19961944     Source Type: Journal    
DOI: 10.3390/ma6010018     Document Type: Article

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