Electrical and optical properties of thin film of amorphous silicon nanoparticles

Applied Surface Science

Volumn 255, Issue 21, 2009, Pages 8874-8878

  Khan, Zishan H ^a,b  

^a KING ABDULAZIZ UNIVERSITY   (Saudi Arabia)

^b JAMIA MILLIA ISLAMIA CENTRAL UNIVERSITY   (India)

Author keywords

AFM; Electrical properties; Fourier transform spectrum; Mott's parameters; Optical properties; Photoluminescence; Physical Vapour Condensation Technique; SEM; Silicon nanoparticles; TEM; Variable range hopping

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CONDENSATION; ELECTRIC PROPERTIES; FIELD EMISSION MICROSCOPES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOPARTICLES; OPTICAL FILMS; OPTICAL PROPERTIES; OXYGEN; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SUBSTRATES; SURFACE ROUGHNESS; TEMPERATURE DISTRIBUTION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CONDENSATION TECHNIQUES; FOURIER TRANSFORM SPECTRA; MOTT'S PARAMETERS; SILICON NANOPARTICLES; VARIABLE RANGE HOPPING;

AMORPHOUS SILICON;

EID: 67651183594     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.06.072     Document Type: Article

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