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Volumn 114, Issue , 2013, Pages 89-98

In situ reflectance imaging of organic thin film formation from solution deposition

Author keywords

Blade coating; Evaporation; OPV; Process control; Reflectance imaging; Spin coating

Indexed keywords

BLADE COATINGS; INTERFERENCE CONDITION; MORPHOLOGY FORMATION; OPV; ORGANIC PHOTOVOLTAICS; RATE OF SOLVENT EVAPORATIONS; REFLECTANCE IMAGING; SOLUTION DEPOSITION;

EID: 84875715896     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2013.02.030     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.