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Thin Solid Films

Volumn 519, Issue 9, 2011, Pages 2678-2681

Real-time studies during coating and post-deposition annealing in organic semiconductors

(7) Campoy Quiles, M a Schmidt, M a Nassyrov, D a Pena O a Goni A R a Alonso, M I a Garriga, M a

a UNIVERSITAT AUTÒNOMA DE BARCELONA (Spain)

Author keywords

Annealing; Dip coating; Ellipsometry; In situ; Organic semiconductors; Photometry; Photovoltaics; Polymers

Indexed keywords

DIP COATING; FILM FORMATIONS; IN-SITU; IN-SITU CRYSTALLIZATION; IN-SITU ELLIPSOMETRY; MATERIAL SYSTEMS; ORGANIC PHOTOVOLTAICS; ORGANIC SEMICONDUCTOR; PHOTOVOLTAICS; POLY (3-HEXYLTHIOPHENE); POLYMER CHAINS; POST DEPOSITION ANNEALING; POST-DEPOSITION; REAL TIME; REAL-TIME STUDIES; SEMICONDUCTOR POLYMERS; SOLUBLE DERIVATIVES; SOLVENT ANNEALING; SPECTROSCOPIC PROBES; THIN FILM FORMATION;

ANNEALING; DEPOSITION; ELLIPSOMETRY; ORGANIC POLYMERS; PHOTOMETERS; PHOTOMETRY; PHOTOVOLTAIC EFFECTS; POLYMERS; THIN FILMS; VAPOR DEPOSITION;

PLASTIC COATINGS;

EID: 79952629136 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.12.228 Document Type: Article

Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.