Simple interferometric microscopy for in situ real-time two-dimensional observation of crystal growth

Review of Scientific Instruments

Volumn 67, Issue 7, 1996, Pages 2584-2587

  Koyama, K ^a   Iwasaki, A ^a   Tanimoto, M ^a   Kudo, I ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039263733     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147190     Document Type: Article

References (4)

1. K. Hirvi, T. Maekelae, J. Pekola, and M. Paalanen, Rev. Sci. Instrum. 65, 2735 (1994).
2. T. J. Dalton, W. T. Conner, and H. H. Sawin, J. Electrochem. Soc. 141, 1893 (1994).
3. M. Born and E. Wolf, Principles of Optics, 5th revised ed. (Pergamon, New York, 1974).
4. A. Iwasaki, M. Hirata, I. Kudo, and T. Sano, Zeolites 16, 35 (1996).