Effect of annealing on optical properties and structure of the vanadium dioxide thin films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8418, Issue , 2012, Pages

  Zhu, Huiqun ^a,b   Li, Yi ^a,c   Li, Yuming ^d   Huang, Yize ^a   Tong, Guoxiang ^a   Fang, Baoying ^a   Zheng, Qiuxin ^a   Li, Liu ^a   Shen, Yujian ^a  

^a UNIVERSITY OF SHANGHAI FOR SCIENCE AND TECHNOLOGY   (China)

^b Wuyi University   (China)

^c Shanghai Key Laboratory of Modern Optical System   (China)

^d Affiliated Jiangmen Traditional Chinese Medicine Hospital of Ji nan University   (China)

Author keywords

structure; thermochromic; transmittance; VO2

Indexed keywords

ANNEALING TEMPERATURES; DC MAGNETRON SPUTTERING; LOW-TEMPERATURE DEPOSITION; SODA LIME GLASS SUBSTRATE; THERMO-CHROMIC; TRANSMITTANCE; VANADIUM DIOXIDE THIN FILMS; VO2;

ANNEALING; DESIGN; FOURIER TRANSFORM INFRARED SPECTROSCOPY; OPTICAL PROPERTIES; STRUCTURE (COMPOSITION); SUBSTRATES; TESTING; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

FILM PREPARATION;

EID: 84875614722     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.978622     Document Type: Conference Paper

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