SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Applied Physics

Volumn 103, Issue 10, 2008, Pages

Effect of ultraviolet irradiation on electrical resistance and phase transition characteristics of thin film vanadium oxide

(2) Ko, Changhyun a Ramanathan, Shriram a

a HARVARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; PHASE TRANSITIONS; ULTRAVIOLET RADIATION; VANADIUM COMPOUNDS;

THIN FILM VANADIUM OXIDE; ULTRAVIOLET IRRADIATION;

THIN FILMS;

EID: 44649111180 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2931006 Document Type: Article

Times cited : (29)

References (21)

1
- 33751326797
- 0163-1829 10.1103/PhysRevB.74.205118.
- M. M. Qazilbash, K. S. Burch, D. Whisler, D. Shrekenhamer, B. G. Chae, H. T. Kim, and D. N. Basov, Phys. Rev. B 0163-1829 10.1103/PhysRevB.74.205118 74, 205118 (2006).
- (2006) Phys. Rev. B , vol.74 , pp. 205118
- Qazilbash, M.M.¹ Burch, K.S.² Whisler, D.³ Shrekenhamer, D.⁴ Chae, B.G.⁵ Kim, H.T.⁶ Basov, D.N.⁷

2
- 34447122609
- 0163-1829 10.1103/PhysRevB.76.035104.
- S. Lysenko, A. Rua, V. Vikhnin, F. Fernandez, and H. Liu, Phys. Rev. B 0163-1829 10.1103/PhysRevB.76.035104 76, 035104 (2007).
- (2007) Phys. Rev. B , vol.76 , pp. 035104
- Lysenko, S.¹ Rua, A.² Vikhnin, V.³ Fernandez, F.⁴ Liu, H.⁵

3
- 34547336500
- 0734-2101 10.1116/1.2734150.
- M. Soltani, M. Chaker, E. Haddad, R. Kruzelecky, and J. Margot, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.2734150 25, 971 (2007).
- (2007) J. Vac. Sci. Technol. A , vol.25 , pp. 971
- Soltani, M.¹ Chaker, M.² Haddad, E.³ Kruzelecky, R.⁴ Margot, J.⁵

4
- 0141705475
- 0163-1829 10.1103/PhysRevB.68.024109.
- H. Katzke, P. Toledano, and W. Depmeier, Phys. Rev. B 0163-1829 10.1103/PhysRevB.68.024109 68, 024109 (2003).
- (2003) Phys. Rev. B , vol.68 , pp. 024109
- Katzke, H.¹ Toledano, P.² Depmeier, W.³

5
- 79956010513
- 0003-6951 10.1063/1.1504641.
- J. F. Xu, R. Czerw, S. Webster, D. L. Carroll, J. Ballato, and R. Nesper, Appl. Phys. Lett. 0003-6951 10.1063/1.1504641 81, 1711 (2002).
- (2002) Appl. Phys. Lett. , vol.81 , pp. 1711
- Xu, J.F.¹ Czerw, R.² Webster, S.³ Carroll, D.L.⁴ Ballato, J.⁵ Nesper, R.⁶

6
- 84956101627
- 0013-4651 10.1149/1.2411002.
- J. B. MacChesney, J. F. Potter, and H. J. Guggenheim, J. Electrochem. Soc. 0013-4651 10.1149/1.2411002 115, 52 (1968).
- (1968) J. Electrochem. Soc. , vol.115 , pp. 52
- MacChesney, J.B.¹ Potter, J.F.² Guggenheim, H.J.³

7
- 0016060794
- 0021-8979 10.1063/1.1663568.
- C. H. Griffiths and H. K. Eastwood, J. Appl. Phys. 0021-8979 10.1063/1.1663568 45, 2201 (1974).
- (1974) J. Appl. Phys. , vol.45 , pp. 2201
- Griffiths, C.H.¹ Eastwood, H.K.²

8
- 84956038307
- 0734-2101 10.1116/1.575304.
- E. Kusano, J. A. Theil, and J. A. Thornton, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.575304 6, 1663 (1988).
- (1988) J. Vac. Sci. Technol. A , vol.6 , pp. 1663
- Kusano, E.¹ Theil, J.A.² Thornton, J.A.³

9
- 3743073885
- 0003-6951 10.1063/1.1654062.
- C. C. Y. Kwan, C. H. Griffiths, and H. K. Eastwood, Appl. Phys. Lett. 0003-6951 10.1063/1.1654062 20, 93 (1972).
- (1972) Appl. Phys. Lett. , vol.20 , pp. 93
- Kwan, C.C.Y.¹ Griffiths, C.H.² Eastwood, H.K.³

10
- 0000863616
- 0734-2101 10.1116/1.576277.
- E. Kusano and J. A. Theil, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.576277 7, 1314 (1989).
- (1989) J. Vac. Sci. Technol. A , vol.7 , pp. 1314
- Kusano, E.¹ Theil, J.A.²

11
- 0008536033
- 0003-6951 10.1063/1.89480.
- J. C. C. Fan, H. R. Fetterman, F. J. Bachner, P. M. Zavracky, and C. D. Parker, Appl. Phys. Lett. 0003-6951 10.1063/1.89480 31, 11 (1977).
- (1977) Appl. Phys. Lett. , vol.31 , pp. 11
- Fan, J.C.C.¹ Fetterman, H.R.² Bachner, F.J.³ Zavracky, P.M.⁴ Parker, C.D.⁵

12
- 33749366784
- 0021-8979 10.1063/1.2345600.
- K. Nagashima, T. Yanagida, H. Tanaka, and T. Kawai, J. Appl. Phys. 0021-8979 10.1063/1.2345600 100, 063714 (2006).
- (2006) J. Appl. Phys. , vol.100 , pp. 063714
- Nagashima, K.¹ Yanagida, T.² Tanaka, H.³ Kawai, T.⁴

13
- 0035886172
- 0003-6951 10.1063/1.1410871.
- S. Ramanathan, G. D. Wilk, D. A. Muller, C. M. Park, and P. C. McIntyre, Appl. Phys. Lett. 0003-6951 10.1063/1.1410871 79, 2621 (2001).
- (2001) Appl. Phys. Lett. , vol.79 , pp. 2621
- Ramanathan, S.¹ Wilk, G.D.² Muller, D.A.³ Park, C.M.⁴ McIntyre, P.C.⁵

14
- 0035851464
- 0003-6951 10.1063/1.1418266.
- S. Ramanathan, D. A. Muller, G. D. Wilk, C. M. Park, and P. C. McIntyre, Appl. Phys. Lett. 0003-6951 10.1063/1.1418266 79, 3311 (2001).
- (2001) Appl. Phys. Lett. , vol.79 , pp. 3311
- Ramanathan, S.¹ Muller, D.A.² Wilk, G.D.³ Park, C.M.⁴ McIntyre, P.C.⁵

15
- 37249013020
- 0021-8979 10.1063/1.2817818.
- D. Ruzmetov, K. T. Zawilski, V. Narayanamurti, and S. Ramanathan, J. Appl. Phys. 0021-8979 10.1063/1.2817818 102, 113715 (2007).
- (2007) J. Appl. Phys. , vol.102 , pp. 113715
- Ruzmetov, D.¹ Zawilski, K.T.² Narayanamurti, V.³ Ramanathan, S.⁴

16
- 4244014869
- 0031-9007 10.1103/PhysRevLett.3.34.
- F. J. Morin, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.3.34 3, 34 (1959).
- (1959) Phys. Rev. Lett. , vol.3 , pp. 34
- Morin, F.J.¹

17
- 0001532854
- 0022-4596
- J. B. Goodenough, J. Vac. Sci. Technol. A 3, 490 (1971). 0022-4596
- (1971) J. Vac. Sci. Technol. A , vol.3 , pp. 490
- Goodenough, J.B.¹

18
- 0039749879
- 1071-1023 10.1116/1.584973.
- G. Lucovsky, S. S. Kim, and J. T. Fitch, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.584973 8, 822 (1990).
- (1990) J. Vac. Sci. Technol. B , vol.8 , pp. 822
- Lucovsky, G.¹ Kim, S.S.² Fitch, J.T.³

19
- 0032159736
- 1071-1023 10.1116/1.590262.
- C. R. Chen, S. F. Hu, P. Chen, H. Hwang, and L. C. Hsia, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.590262 16, 2712 (1998).
- (1998) J. Vac. Sci. Technol. B , vol.16 , pp. 2712
- Chen, C.R.¹ Hu, S.F.² Chen, P.³ Hwang, H.⁴ Hsia, L.C.⁵

20
- 0001189328
- 0021-8979 10.1063/1.373515.
- Z. Cui, J. M. Madsen, and C. G. Takoudis, J. Appl. Phys. 0021-8979 10.1063/1.373515 87, 8181 (2000).
- (2000) J. Appl. Phys. , vol.87 , pp. 8181
- Cui, Z.¹ Madsen, J.M.² Takoudis, C.G.³

21
- 34249910898
- 0013-4651 10.1149/1.2737347.
- C. L. Chang and S. Ramanathan, J. Electrochem. Soc. 0013-4651 10.1149/1.2737347 154, G160 (2007).
- (2007) J. Electrochem. Soc. , vol.154 , pp. 160
- Chang, C.L.¹ Ramanathan, S.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.