Nanostructure and thermal-optical properties of vanadium dioxide thin films

Chinese Optics Letters

Volumn 3, Issue 12, 2005, Pages 719-721

  Li, Yi ^a   Yi, Xinjian ^a   Zhang, Tianxu ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; FILM PREPARATION; FUSED SILICA; MORPHOLOGY; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OXIDES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SUPERCONDUCTING TRANSITION TEMPERATURE; THERMOCOUPLES; THIN FILMS; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

TRANSITION TEMPERATURE; VANADIUM DIOXIDE;

SEMICONDUCTING FILMS;

EID: 33644660230     PISSN: 16717694     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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