Angle-resolved XPS analysis and characterization of monolayer and multilayer silane films for DNA coupling to silica

Langmuir

Volumn 29, Issue 12, 2013, Pages 4057-4067

  Shircliff, Rebecca A ^a   Stradins, Paul ^b   Moutinho, Helio ^b   Fennell, John ^a   Ghirardi, Maria L ^b   Cowley, Scott W ^a   Branz, Howard M ^b   Martin, Ina T ^a,c  

^a Department of Geology and Geological Engineering   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

3-AMINOPROPYLTRIETHOXYSILANE; ANGLE-RESOLVED XPS; COUPLING EFFICIENCY; DNA DOUBLE HELICES; DNA IMMOBILIZATION; HYBRIDIZATION EFFICIENCY; SILANE MONOLAYERS; STERIC HINDRANCES;

ATOMIC FORCE MICROSCOPY; CHEMICAL REACTIONS; DEPOSITION; EFFICIENCY; MONOLAYERS; MULTILAYER FILMS; PHOTOELECTRONS; SILANES; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY;

DNA;

(3 AMINOPROPYL)DIMETHYLETHOXYSILANE; (3-AMINOPROPYL)DIMETHYLETHOXYSILANE; 3 AMINOPROPYLTRIETHOXYSILANE; CROSS LINKING REAGENT; DNA; GAMMA-AMINOPROPYLTRIETHOXYSILANE; PHOSPHORUS; PROPYLAMINE; SILANE DERIVATIVE; SILICON DIOXIDE; SUCCINIMIDE DERIVATIVE; WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; NUCLEIC ACID HYBRIDIZATION; RADIOMETRY; SURFACE PROPERTY; SYNTHESIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CROSS-LINKING REAGENTS; DNA; MICROSCOPY, ATOMIC FORCE; NUCLEIC ACID HYBRIDIZATION; PHOSPHORUS RADIOISOTOPES; PHOTOELECTRON SPECTROSCOPY; PROPYLAMINES; RADIOMETRY; SILANES; SILICON DIOXIDE; SUCCINIMIDES; SURFACE PROPERTIES; WATER;

EID: 84875597211     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la304719y     Document Type: Article

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