Defect structures in ZnO studied by high-resolution structural and spectroscopic imaging

Ultramicroscopy

Volumn 127, Issue , 2013, Pages 76-84

  Schmid, H ^a   Okunishi, E ^b   Mader, W ^c  

^a INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

^b JEOL LTD   (Japan)

^c UNIVERSITY OF BONN   (Germany)

Author keywords

ABF STEM; Atomic resolution; Inversion domain boundaries; Spectroscopic imaging; ZnO

Indexed keywords

ABF-STEM; ATOMIC RESOLUTION; INVERSION DOMAIN BOUNDARIES; SPECTROSCOPIC IMAGING; ZNO;

ATOMS; DOPING (ADDITIVES); MONOLAYERS; NANORODS; OXYGEN; POSITIVE IONS; X RAY SPECTROSCOPY;

ZINC OXIDE;

ZINC OXIDE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; ILLUMINATION; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGING; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; SPECTROSCOPY; THERMODYNAMICS;

EID: 84875540658     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.07.014     Document Type: Article

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