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Volumn , Issue , 2013, Pages 343-346

Low temperature adhesive wafer bonding using OSTE(+) for heterogeneous 3D MEMS integration

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE WAFER BONDING; BOND ENERGIES; DUAL CURE SYSTEMS; HIGH-QUALITY MATERIALS; LOW-TEMPERATURE ADHESIVES; NANO-IMPRINT; OXYGEN PLASMAS; THERMAL CURES;

EID: 84875443694     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MEMSYS.2013.6474248     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 3
    • 84868206434 scopus 로고    scopus 로고
    • Eutectic and solid-state wafer bonding of silicon with gold
    • M. Abouie, Q. Liu and G. Iveym, "Eutectic and solid-state wafer bonding of silicon with gold", Materials Science and Engineering B, vol. 177, pp. 1748-1758, 2012.
    • (2012) Materials Science and Engineering B , vol.177 , pp. 1748-1758
    • Abouie, M.1    Liu, Q.2    Iveym, G.3
  • 5
    • 68849118449 scopus 로고    scopus 로고
    • Wafer bonding with nano-imprint resists as sacrificial adhesive for fabrication of silicon-on-integrated-circuit (SOIC) wafers in 3D integration of MEMS and ICs
    • F. Niklaus, A. Decharat, F. Forsberg, N. Roxhed, M. Lapisa, M. Populin, F. Zimmer, J. Lemm and G. Stemme, "Wafer Bonding with Nano-Imprint Resists as Sacrificial Adhesive for Fabrication of Silicon-On-Integrated-Circuit (SOIC) Wafers in 3D Integration of MEMS and ICs", Sensors and Actuators A: Physical, Vol. 154, pp. 180-186, 2009.
    • (2009) Sensors and Actuators A: Physical , vol.154 , pp. 180-186
    • Niklaus, F.1    Decharat, A.2    Forsberg, F.3    Roxhed, N.4    Lapisa, M.5    Populin, M.6    Zimmer, F.7    Lemm, J.8    Stemme, G.9
  • 9
    • 33644812081 scopus 로고    scopus 로고
    • Critical adhesion energy of benzocyclobutene-bonded wafers
    • Y. Kwon, J. Seok, J.Q Lu, T.S. Cale and R.J Gutmann, "Critical Adhesion Energy of Benzocyclobutene-Bonded Wafers", J. Electrochem. Soc., vol. 153, no. 4, pp. G347-G352, 2006.
    • (2006) J. Electrochem. Soc. , vol.153 , Issue.4
    • Kwon, Y.1    Seok, J.2    Lu, J.Q.3    Cale, T.S.4    Gutmann, R.J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.