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Volumn 11, Issue 5, 2011, Pages 1925-1927

Insulating behavior in ultrathin bismuth selenide field effect transistors

Author keywords

bismuth selenide; field effect transistor; surface state; topological insulator

Indexed keywords

BISMUTH SELENIDE; CONDUCTANCE MEASUREMENT; MECHANICAL EXFOLIATION; NEGATIVE GATE VOLTAGES; SURFACE STATE; TEMPERATURE DEPENDENT; TOPOLOGICAL INSULATOR; ULTRA-THIN;

EID: 79955925120     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl200017f     Document Type: Article
Times cited : (173)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.