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Volumn 12, Issue , 2010, Pages
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Effective continuous model for surface states and thin films of three-dimensional topological insulators
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Author keywords
[No Author keywords available]
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Indexed keywords
ANGLE-RESOLVED PHOTOEMISSION;
ASYMMETRIC DISTRIBUTION;
CHERN NUMBERS;
CONTINUOUS MODELS;
ENERGY SPECTRA;
EXPERIMENTAL DATA;
FINITE THICKNESS;
FIRST-PRINCIPLES CALCULATION;
INVERSION ASYMMETRY;
QUANTUM SPIN HALLS;
REGION-BASED;
SEMI-INFINITE;
SIC SUBSTRATES;
SPLITTINGS;
SURFACE STATE;
EMISSION SPECTROSCOPY;
FILM GROWTH;
FILM THICKNESS;
SEMICONDUCTING SELENIUM COMPOUNDS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SILICON CARBIDE;
TENSORS;
THIN FILMS;
TOPOLOGY;
TWO DIMENSIONAL;
THREE DIMENSIONAL;
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EID: 77952329302
PISSN: 13672630
EISSN: None
Source Type: Journal
DOI: 10.1088/1367-2630/12/4/043048 Document Type: Article |
Times cited : (474)
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References (43)
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