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Volumn 8, Issue 12, 2008, Pages 4597-4602

Reversible basal plane hydrogenation of graphene

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT OXYGENS; BASAL PLANES; CHARGE TRANSPORT PROPERTIES; DOUBLE LAYERS; ELECTRON-INDUCED DISSOCIATIONS; FUNCTIONALIZATION; GRAPHENE; GRAPHENE DEVICES; HOLE-DOPING; HYDROGEN ATOMS; HYDROGEN-SILSESQUIOXANE; IN-SITU; PHOTOTHERMALLY; RAMAN D BANDS; SINGLE LAYERS; STICKING PROBABILITIES; THERMAL-ANNEALING;

EID: 59149103208     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl802940s     Document Type: Article
Times cited : (539)

References (44)
  • 13
    • 0037116053 scopus 로고    scopus 로고
    • Ruffieux, P.; Gröning, O.; Bielmann, M.; Mauron, P.; Schlapbach, N/A; Gröning, P. Phys. Rev. B 2002, 66, 245416.
    • Ruffieux, P.; Gröning, O.; Bielmann, M.; Mauron, P.; Schlapbach, N/A; Gröning, P. Phys. Rev. B 2002, 66, 245416.
  • 38
    • 84868908094 scopus 로고    scopus 로고
    • Knox, K. R.; Wang, S.; Morgante, A.; Cvetko, D.; Locatelli, A.; Mentes, T. O.; Niño, M. A.; Kim, P. R. M. O., Jr. http://arxiv.org/abs/0806.0355vl (accessed November 14, 2008).
    • Knox, K. R.; Wang, S.; Morgante, A.; Cvetko, D.; Locatelli, A.; Mentes, T. O.; Niño, M. A.; Kim, P. R. M. O., Jr. http://arxiv.org/abs/0806.0355vl (accessed November 14, 2008).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.