Surface morphology analysis of HgI2 and PbI2 with interference microscopy - The challenges of measuring fragile materials and deep surface roughness

Physica Status Solidi C: Conferences

Volumn , Issue 3, 2003, Pages 1044-1050

  Montgomery, P C ^a   Ponpon, J P ^a   Sieskind, M ^a   Draman, C ^b  

^a Faculté de Médecine   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FRAGILE MATERIALS; INTERFERENCE MICROSCOPY; MEASUREMENT ACCURACY; NUCLEAR DETECTORS; SCANNING WHITE LIGHT INTERFEROMETRY; SURFACE MORPHOLOGY ANALYSIS; THIN SURFACE FILMS; TYPE INTERFERENCE;

FILMS; MERCURY COMPOUNDS; SEMICONDUCTOR MATERIALS; SURFACE MORPHOLOGY; SURFACE ROUGHNESS;

SURFACES;

EID: 84875094846     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200306236     Document Type: Conference Paper

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