Surface effects of the HgI2 crystal characterized by spectroscopic ellipsometry

Applied Optics

Volumn 40, Issue 25, 2001, Pages 4519-4525

  Naciri, Aotmane En ^a   Johann, Luc ^a   Kleim, Roland ^a   Sieskind, Manuel ^b   Amann, Marianne ^b  

^a Lab Phys Liquides et Interfaces   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPLEXATION; ELLIPSOMETRY; ETCHING; LIGHT POLARIZATION; REGRESSION ANALYSIS; SPECTROSCOPY; SURFACE PHENOMENA; SURFACE ROUGHNESS;

SPECTROSCOPIC ELLIPSOMETRY;

MERCURY COMPOUNDS;

EID: 0038500732     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.004519     Document Type: Article

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