Compact model and performance estimation for tunneling nanowire FET

Device Research Conference - Conference Digest, DRC

Volumn , Issue , 2011, Pages 197-198

  Solomon, P M ^a   Frank, D J ^a   Koswatta, S O ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT MODEL; CONVENTIONAL MOSFETS; MULTI-PARAMETER OPTIMIZATIONS; NANOWIRE FET; PARAMETER OPTIMIZATION; PERFORMANCE ESTIMATION; SWITCHING BEHAVIORS;

CIRCUIT SIMULATION; OPTIMIZATION;

FIELD EFFECT TRANSISTORS;

EID: 84874865212     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2011.5994495     Document Type: Conference Paper

References (7)

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3. S. Mookerjea, R. Krishnan, S. Datta, and V. Narayanan, IEEE TED, v. 56, p. 2092, 2009.
4. B. Yu, , L. Wang, Y. Yuan, P. M. Asbeck, and Y. Taur, IEEE Trans. Electron. Dev., vol. 55, p. 2846, 2008.
5. S.O. Koswatta and M.S. Lundstrom and D.E. Nikonov, Appl Phys Lett., vol. 92, 043125, 2008.
6. D. J. Frank, et al., IBM J. Res. Dev., 50, pp.419-431, 2006.
7. S.E. Laux, unpublished.