Piezoresistive Ni:a-C:H thin films containing hcp-Ni or Ni3C investigated by XRD, EXAFS, and wavelet analysis

Diamond and Related Materials

Volumn 34, Issue , 2013, Pages 25-35

  Uhlig, Steffen ^a   Struis, Rudolf ^c   Schmid Engel, Hanna ^a   Bock, Jochen ^b   Probst, Anne Catherine ^a   Freitag Weber, Olivia ^a   Zizak, Ivo ^d   Chernikov, Roman ^e   Schultes, Günter ^a  

^a Saarland University of Applied Sciences   (Germany)

^b ZeMA GGmbH   (Germany)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d HAHN MEITNER INSTITUT   (Germany)

^e DESY   (Germany)

Author keywords

EXAFS; hcp Ni; Ni:a C:H thin film; Ni3C; Wavelet analysis

Indexed keywords

CO-EXISTENCE; COORDINATION SHELLS; CRYSTAL PHASIS; EXAFS; EXAFS ANALYSIS; EXAFS DATA; HCP-NI; NEAREST NEIGHBOUR; NI ATOMS; NI:A-C:H; PIEZO-RESISTIVE; REACTIVE SPUTTERING PROCESS; THIN-FILM DEPOSITIONS; WAVELET TRANSFORMATIONS; XRD; XRD PEAKS;

CARBON; THIN FILMS; WAVELET ANALYSIS;

NICKEL;

EID: 84874720146     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2013.01.013     Document Type: Article

References (25)

1. G. Schultes, P. Frey, D. Goettel, and O. Freitag-Weber Diam. Relat. Mater. 15 1 2006 80 89
2. M. Petersen, U. Heckmann, R. Bandorf, V. Gwozdz, S. Schnabel, and G. Bräuer Diam. Relat. Mater. 20 5-6 2011 814 818
3. R. Koppert, S. Uhlig, H. Schmid-Engel, D. Göttel, A.C. Probst, and G. Schultes Diam. Relat. Mater. 25 2012 50 58
4. R. Koppert, Nickelhaltige Kohlenwasserstoff-Funktionsschichten (Ni:a-C:H) für Drucksensoren, Ph.D. thesis, Saarland University, 2010.
5. G. Abrasonis, G.J. Kovács, L. Ryves, M. Krause, A. Mücklich, and F. Munnik J. Appl. Phys. 105 8 2009 083518 (pages 8)
6. G. Abrasonis, G.J. Kovács, A. Mücklich, S. Zhou, D. Babonneau, and A. Martinavičius J. Phys. Chem. C 113 20 2009 8645 8651
7. K. Sedláčková, P. Lobotka, I. Vávra, and G. Radnózi Carbon 43 10 2005 2192 2198
8. L. He J. Magn. Magn. Mater. 322 14 2010 1991 1993
9. M. Huth J. Appl. Phys. 107 11 2010 113709 (pages 7)
10. G. Abrasonis, A. Scheinost, S. Zhou, R. Torres, R. Gago, and I. Jimeénez J. Phys. Chem. C 112 33 2008 12628 12637
11. B. Ingham, N. Gaston, K. Fahy, X.Y. Chin, C.J. Dotzler, and E. Rees J. Phys. Chem. C 116 10 2012 6159 6165
12. R. Prins, and D. Koningsberger X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES 1988 John Wiley & Sons New York
13. W. Kraus, and G. Nolze Powdercell 2.3 2000 BAM Berlin (URL http://www.bam.de/de/service/publikationen/powder-cell.htm)
14. G. Bunker Introduction to XAFS - A Practical Guide to X-ray Absorption Fine Structure Spectroscopy 2010 Cambridge University Press
15. M. Muñoz, P. Argoul, and F. Farges Am. Mineral. 88 4 2003 694 700
16. R.P.W.J. Struis, D. Bachelin, C. Ludwig, and A. Wokaun J. Phys. Chem. C 113 6 2009 2443 2451
17. A. Erko, and I. Zizak Spectrochim. Acta B At. Spectrosc. 64 9 2009 833 848
18. K. Rickers, W. Drube, H. Schulte-Schrepping, E. Welter, U. Brüggmann, and M. Herrmann AIP Conf. Proc. 882 1 2007 905 907
19. K.V. Klementev J. Phys. D: Appl. Phys. 34 2 2001 209 217
20. K. Klementiev VIPER - Visual Processing in EXAFS Researches URL http://www.cells.es/Beamlines/CLAESS/software/viper.html 2011
21. AGU-Vallen Wavelet Wavelets, Choi-Williams transformation and dispersion curves http://www.vallen.de/wavelet/index.html 2010
22. R Development Core Team R: A Language and Environment for Statistical Computing 2010 R Foundation for Statistical Computing Vienna, Austria 3-900051-07-0 (URL http://www.R-project.org)
23. Y. Leng, L. Xie, F. Liao, J. Zheng, and X. Li Thermochim. Acta 473 1-2 2008 14 18
24. G. Carturan, G. Cocco, S. Enzo, R. Ganzerla, and M. Lenarda Mater. Lett. 7 1-2 1988 47 50
25. J.S. Gibson, J. Uddin, T.R. Cundari, N.K. Bodiford, and A.K. Wilson J. Phys. Condens. Matter 22 44 2010 445503 445508