Extended X-ray absorption fine structure and x-ray diffraction examination of sputtered nickel carbon binary thin films for fuel cell applications

Journal of Physical Chemistry C

Volumn 116, Issue 10, 2012, Pages 6159-6165

  Ingham, Bridget ^a,b   Gaston, Nicola ^a,b   Fahy, Kieran ^c   Chin, Xiao Yao ^c   Dotzler, Christian J ^a   Rees, Eric ^c   Haslam, Gareth ^c   Barber, Zoe H ^c   Burstein, G Timothy ^c   Ryan, Mary P ^d  

^a CALLAGHAN INNOVATION   (New Zealand)

^b VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

A-CARBON; ACIDIC SOLUTIONS; CARBON ALLOYS; COMPOSITIONAL REGION; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FUEL CELL APPLICATION; NEAREST-NEIGHBORS; NI ATOMS; THRESHOLD CONCENTRATIONS;

ABSORPTION SPECTRA; CARBON; ELECTROCATALYSTS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION;

ATOMS;

EID: 84858304549     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp207308g     Document Type: Article

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