New XAFS facility for in-situ measurements at beamline C at HASYLAB

AIP Conference Proceedings

Volumn 882, Issue , 2007, Pages 905-907

  Rickers, K ^a   Drube, W ^a   Schulte schrepping, H ^a   Welter, E ^a   Bruggmann U ^a   Herrmann, M ^a   Heuer, J ^a   Schulz ritter, H ^a  

^a DESY   (Germany)

Author keywords

Double crystal fixed exit monochromator; In situ XAFS experiments

Indexed keywords

EID: 33947398775     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2644700     Document Type: Conference Paper

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