X-ray spectroscopic and magnetic investigation of C:Ni nanocomposite films grown by ion beam cosputtering

Journal of Physical Chemistry C

Volumn 112, Issue 33, 2008, Pages 12628-12637

  Abrasonis, G ^a   Scheinost, A C ^a,b   Zhou, S ^a   Torres, R ^c   Gago, R ^d   Jimenez I ^d   Kuepper, K ^a   Potzger, K ^a   Krause, M ^a   Kolitsch, A ^a   Moller W ^a   Bartkowski, S ^e   Neumann, M ^e   Gareev, R R ^c  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITY OF REGENSBURG   (Germany)

^d INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^e UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; ATOMIC PHYSICS; ATOMS; BEAM PLASMA INTERACTIONS; CARBON FILMS; DICHROISM; ELECTROMAGNETIC WAVE ABSORPTION; ELECTROMAGNETIC WAVES; ELECTRONIC STRUCTURE; ENERGY ABSORPTION; GROWTH TEMPERATURE; ION BEAMS; ION BOMBARDMENT; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETISM; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NICKEL; OPTICAL PROPERTIES; PHOTOELECTRON SPECTROSCOPY; QUANTUM INTERFERENCE DEVICES; SPECTRUM ANALYSIS; SQUIDS; SUPERCONDUCTING MAGNETS; SUPERPARAMAGNETISM; X RAY ABSORPTION; X RAY ANALYSIS; X RAYS;

CO-SPUTTERING; METALLIC STATES; TEMPERATURE RANGES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 51049083817     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp8011415     Document Type: Article

References (49)

1. Hayashi. T.; Hirono, S.; Tomita, M.; Umemura, S. Nature 1996, 381, 772-774.
2. Knotek, O.; Lugscheider, E.; Löffler, F.; Bosserhoff, B.; Schmitz, S. Mater. Sci. Eng. A: Struct. Mater. Prop. Microstruct. Process. 1996, 209, 394-398.
3. Voevodin, A. A.; Prasad. S. V.; Zabinski, J. S. J. Appl. Phys. 1997, 82, 855-858
4. Wang, H.; Yang, F. J.; Hu, M. Z.; Zhou, B.; Gu, H. S.; Chiah, M. F.; Cheung, W. Y.; Wong, S. P. Physica B 2004, 351, 77-82.
5. Chen, P.; Wong, S. P.; Chiah, M. F.; Wang, H.; Cheung, W. Y.; Ke, N.; Xiao, Z. S. Appl. Phys. Lett. 2002, 81, 4799-4801.
6. Babonneau, D.; Briatico, J.; Petroff, F.; Cabioc'h, T.; Naudon, A. J. Appl. Phys. 2000, 87, 3432-3443.
7. Fonseca, F. C.; Ferlauto, A. S.; Alvarez, F.; Goya, G. F.; Jardim, R. F. J. Appl, Phys. 2005, 97, 7.
8. Sedlaková, K.; Lobotka, P.; Vávra, I.; Radnóczi, G. Carbon 2005, 43, 2192-2198.
9. Jaouen, N.; Babonneau, D.; Tonnerre, J. M.; Carbone, D.; Wilhelm, F.; Rogalev, A.; Johal, T. K.; van der Laan, G. Phys. Rev. B. 2007, 76, 104421.
10. Cabioc'h, T.; Naudon, A.; Jaouen, M.; Thiaudiere, D.; Babonneau, D. Philos. Mag. B 1999, 79, 501-516.
11. Abrasonis, G.; Krause, M.; Mücklich, A.; Sedlacková, K.; Radnóczi, G.; Kreissig, U.; Kolitsch, A.; Möller, W. Carbon 2007, 45, 2995-3006.
12. Binary Alloy Phase Diagrams; Massalski, T. B., Ed.; ASM International: Metals Park, OH, 1990.
13. Meyer, G.; Scheffer, F. E. C. J. Am. Chem. Soc. 1953, 75, 486-486.
14. Oliete, P. B.; Rojas, T. C.; Fernandez, A.; Gedanken, A.; Koltypin, Y.; Palacio, F. Acta Mater. 2004, 52, 2165-2171.
15. Yue, L. P.; Sabiryanov, R.; Kirkpatrick, E. M.; Leslie-Pelecky, D. L. Phys. Rev. B. 2000, 62, 8969-8975.
16. Booth, C. H.; Bridges, F. Improved self-absorption correction for extended X-ray absorption fine-structure measurements. Paper LBNL-52864, 2003.
17. Ravel, B.; Newville, M. J. Synchrot. Radiat. 2005, 12, 537-541.
18. Sutherland, D. G. J.; Akatsu, H.; Copel, M.; Himpsel, F. J.; Calicot, T. A.; Carlisle, J. A.; Ederer, D. L.; Jia, J. J.; Jimenez, I.; Perera, R.; Shuh, D. K.; Terminello, L. J.; Tong, W. M. J. Appl. Phys. 1995, 78, 6761-6769.
19. Takenaka, S.; Ogihara, H.; Otsuka, K. J. Catal. 2002, 205, 54-63.
20. Singh, V.; Palshin, V.; Tittsworth, R.; Meletis, E. Carbon 2006, 44, 1280-1286.
21. Zabinsky, S. I.; Rehr, J. J.; Ankudinov, A.; Albers, R. C.; Eller, M. J. Phys. Rev. B 1995, 52, 2995-3009.
22. Nagakura, S. J. Phys. Soc. Jpn. 1958, 13, 1005-1014.
23. Haglund, J.; Guillermet, A. F.; Grimvall, G.; Korling, M. Phys. Rev. B. 1993, 48, 11685-11691.
24. Teo, B. K. EXAFS: Basic Principles and Data Analysis; Inorganic Chemistry Concepts; Springer-Verlag: New York, 1986.
25. Greegor, R.; Lytle, F. J. Catal. 1980, 63, 476-486.
26. Nesvizhskii, A. I.; Ankudinov, A. L.; Rehr, J. J.; Baberschke, K. Phys. Rev. B. 2000, 62, 15295-15298.
27. de Groot, F. Chem. Rev. 2001, 101, 1779-1808.
28. Nesbitt, H. W.; Legrand, D.; Bancroft, G. M. Phys. Chem. Miner. 2000, 27, 357-366.
29. Hüfner, S. Photoelectron Spectroscopy: Principles and Applications; Springer, New York, 2003.
30. Grosvenor, A. P.; Biesinger, M. C.; Smart, R. S.; McIntyre, N. S. Surf. Sci. 2006, 600, 1771-1779.
31. Zdansky, E. O. F.; Nilsson, A.; Martensson, N. Surf. Sci. 1994, 310, L583-L588.
32. Abrasonis, G.; Berndt, M.; Krause, M.; Kuepper, K.; Munnik, F.; Kolitsch, A.; Möller, W. J. Phys. Chem. C, submitted for publication.
33. Benchikh, N.; Garrelie, F.; Donnet, C.; Bouchet-Fabre, B.; Wolski, K.; Rogemond, F.; Loir, A. S.; Subtil, J. L. Thin Solid Films 2005, 482, 287-292.
34. Stöhr, J. NEXAFS Spectroscopy; Springer: New York, 1992.
35. Fischer, D. A.; Wentzcovitch, R. M.; Carr, R. G.; Continenza, A.; Freeman, A. J. Phys. Rev. B 1991, 44, 1427-1429.
36. Jaouen, M.; Tourillon, G.; Delafond, J.; Junqua, N.; Hug, G. Diamond Retat. Mater. 1995, 4, 200-206.
37. Diaz, J.; Anders, S.; Cossy-Favre, A.; Samant, M.; Stöhr, J. J. Vac. Sci. Technol. A 1999, 17, 2737-2740.
38. Diaz, J.; Anders, S.; Zhou, X.; Moler, E. J.; Kellar, S. A.; Hussain, Z. Phys. Rev. B 2001, 6412, 19.
39. Lenardi, C.; Piseri, P.; Briois, V.; Bottani, C. E.; Bassi, A. L.; Milani, P. J. Appl. Phys. 1999, 85, 7159-7167.
40. Abbas, M.; Wu, Z. Y.; Zhong, J.; Ibrahim, K.; Fiori, A.; Orlanducci, S.; Sessa, V.; Terranova, M. L.; Davoli, I. Appl. Phys. Lett. 2005, 87, 3.
41. Stöhr, J.; Siegmann, H. C. Magnetism: From Fundamentals to Nanoscale Dynamics; Springer, New York, 1992; Vol. 152.
42. Chen, C.; Idzerda, Y.; Lin, H.; Smith, N.; Meigs, G.; Chaban, E.; Ho, G.; Pellegrin, E.; Sette, F. Phys. Rev. Lett. 1995, 75, 152-155.
43. Nakajima, R.; Stohr, J.; Idzerda, Y. U. Phys. Rev. B 1999, 59, 6421-6429.
44. Gota, S.; Gautier-Soyer, M.; Sacchi, M. Phys. Rev. B 2000, 62, 4187-4190.
45. Regan, T. J.; Ohldag, H.; Stamm, C.; Nolting, F.; Luning, J.; Stohr, J.; White, R. L. Phys. Rev. B 2001, 6421, 214422.
46. Jo, T.; Sawytzky, G. A. Phys. Rev. B 1991, 43, 8771-8774.
47. Goering, E.; Gold, S.; Bayer, A.; Schuetz, G. J. Synchrot. Radiat. 2001, 8, 434.
48. Tsoi, G. M.; Wenger, L. E.; Senaratne, U.; Tackett, R. J.; Buc, E. C.; Naik, R.; Vaishnava, P. P.; Naik, V. Phys. Rev. B 2005, 72, 014445.
49. Nie, X.; Jiang, J. C.; Tung, L. D.; Spinu, L.; Meletis, E. I. Thin Solid Films 2002, 415, 211-218.