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Volumn , Issue , 2006, Pages 741-746
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Gate sizing and replication to minimize the effects of virtual ground parasitic resistances in MTCMOS designs
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Author keywords
[No Author keywords available]
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Indexed keywords
DESIGN METHODOLOGY;
GROUND NETWORKS;
LOGIC RESTRUCTURING;
MTCMOS CIRCUITS;
MULTI-THRESHOLD CMOS;
PARASITIC RESISTANCES;
SLEEP TRANSISTORS;
SUB-THRESHOLD LEAKAGE CURRENTS;
CMOS INTEGRATED CIRCUITS;
DESIGN;
LEAKAGE CURRENTS;
LOGIC CIRCUITS;
LOGIC DEVICES;
TRANSISTORS;
GATES (TRANSISTOR);
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EID: 84874651323
PISSN: 19483287
EISSN: 19483295
Source Type: Conference Proceeding
DOI: 10.1109/ISQED.2006.70 Document Type: Conference Paper |
Times cited : (7)
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References (10)
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