Secondary electron imaging at atomic resolution using a focused coherent electron probe

Physical Review B - Condensed Matter and Materials Physics

Volumn 87, Issue 5, 2013, Pages

  Brown, H G ^a   D'Alfonso, A J ^a   Allen, L J ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84874150810     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.054102     Document Type: Article

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