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Volumn 2, Issue 1, 2012, Pages

Bismuth nanowire growth under low deposition rate and its ohmic contact free of interface damage

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; DEPOSITION RATES; ELECTRIC CONTACTORS; OHMIC CONTACTS; SINGLE CRYSTALS;

EID: 84874045000     PISSN: None     EISSN: 21583226     Source Type: Journal    
DOI: 10.1063/1.3679086     Document Type: Article
Times cited : (12)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.