SCOPUS 정보 검색 플랫폼

Volumn 96, Issue 8, 2010, Pages

Weak-antilocalization signatures in the magnetotransport properties of individual electrodeposited Bi Nanowires

(10) Marcano, N a Sangiao, S a Plaza, M b Prez L b Pacheco, A Fernández a Cordoba R a Sanchez M C b Morellon L a Ibarra, M R a De Teresa, J M a

a UNIVERSITY OF ZARAGOZA (Spain)

b UNIVERSIDAD COMPLUTENSE DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-LOCALIZATION SIGNATURES; BI NANOWIRES; BREAKING LENGTH; ELECTRICAL RESISTIVITY; FOUR-PROBE METHODS; LOW RESISTANCE; MAGNETO TRANSPORT PROPERTIES; MAGNETORESISTANCE MEASUREMENTS; NANOCONTACTS; TEMPERATURE RANGE; WEAK ANTILOCALIZATION;

ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTRODEPOSITION; MAGNETIC FIELD EFFECTS; MAGNETORESISTANCE; NANOWIRES; OHMIC CONTACTS; SEMICONDUCTOR QUANTUM DOTS;

ELECTRIC WIRE;

EID: 77749254885 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3328101 Document Type: Article

Times cited : (28)

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