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Volumn 200, Issue , 2013, Pages 84-89
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Investigations on the growth and characterization of vertically aligned zinc oxide nanowires by radio frequency magnetronsputtering
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Author keywords
Carrier concentration; Photoluminescence; Point defects; Raman; Sputtering; ZnO nanowires
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Indexed keywords
C-AXIS ORIENTATIONS;
DENSITY DISTRIBUTIONS;
LOW TEMPERATURE PHOTOLUMINESCENCE;
RAMAN;
RF MAGNETRON SPUTTERING TECHNIQUE;
SILICON (111) SUBSTRATES;
ZINC OXIDE NANOWIRES;
ZNO NANOWIRES;
CARRIER CONCENTRATION;
CRYSTALLINE MATERIALS;
ELECTRON TRANSITIONS;
FULL WIDTH AT HALF MAXIMUM;
MAGNETRON SPUTTERING;
OPTICAL PROPERTIES;
PHOTOLUMINESCENCE;
POINT DEFECTS;
SPUTTERING;
X RAY DIFFRACTION;
ZINC OXIDE;
ZINC SULFIDE;
NANOWIRES;
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EID: 84873700939
PISSN: 00224596
EISSN: 1095726X
Source Type: Journal
DOI: 10.1016/j.jssc.2013.01.024 Document Type: Article |
Times cited : (30)
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References (35)
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