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Volumn 24, Issue 8, 2013, Pages

InAs1-xPx nanowires grown by catalyst-free molecular-beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

CATALYST-FREE; ENERGY DISPERSIVE X RAY SPECTROSCOPY; GROWTH CHAMBER; INAS; INCORPORATION RATES; PHOSPHORUS CONTENTS; PHOSPHORUS INCORPORATION; SELF-CATALYSED GROWTH; SI(111) SUBSTRATE; SOLID-SOURCE MOLECULAR BEAM EPITAXY; WURTZITES; X-RAY DIFFRACTION MEASUREMENTS; ZINCBLENDE STRUCTURES;

EID: 84873424536     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/8/085707     Document Type: Article
Times cited : (16)

References (21)
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  • 13
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    • Beam equivalent pressure measurements in chemical beam epitaxy
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    • Joyce T B and Bullough T J 1993 J. Cryst. Growth 127 265-9 (Pubitemid 23688213)
    • (1993) Journal of Crystal Growth , vol.127 , Issue.1-4 , pp. 265-269
    • Joyce, T.B.1    Bullough, T.J.2
  • 17
    • 27844583800 scopus 로고
    • 10.1007/BF01349680 1434-6001
    • Vegard L 1921 Z. Phys. 5 17
    • (1921) Z. Phys. , vol.5 , Issue.1 , pp. 17
    • Vegard, L.1
  • 19
    • 79954479071 scopus 로고    scopus 로고
    • 10.1021/nl1041512 1530-6984
    • Kriegner D et al 2011 Nano Lett. 11 1483-9
    • (2011) Nano Lett. , vol.11 , Issue.4 , pp. 1483-1489
    • Kriegner, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.