SCOPUS 정보 검색 플랫폼

Measurement Science and Technology

Volumn 13, Issue 8, 2002, Pages 1217-1222

Near-field photothermal Fourier transform infrared spectroscopy using synchotron radiation

(6) Bozec, L a Hammiche, A a Tobin, M J b Chalmers, J M c,d Everall, N J e Pollock, H M a

a LANCASTER UNIVERSITY (United Kingdom)

b DARESBURY LABORATORY (United Kingdom)

c UNIVERSITY OF NOTTINGHAM (United Kingdom)

d V S Consulting (United Kingdom)

e Wilton Centre (United Kingdom)

Author keywords

FT IR; Localized spectroscopy; Near field; Photothermal; Synchrotron

Indexed keywords

ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED RADIATION; INTERFACES (MATERIALS); OPTICAL COLLIMATORS; OPTICAL MICROSCOPY; POLYPROPYLENES; SENSORS; TEMPERATURE MEASUREMENT; THERMAL NOISE;

PHOTOTHERMAL SPECTROSCOPY;

SYNCHROTRON RADIATION;

SPECTROSCOPY;

EID: 0036678875 PISSN: 09570233 EISSN: None Source Type: Journal
DOI: 10.1088/0957-0233/13/8/308 Document Type: Article

Times cited : (25)

References (24)

1
- 0035890785
- Localized photothermal infrared spectroscopy using a proximal probe
- (2001) J. Appl. Phys , vol.90 , pp. 5159-5165
- Bozec, L.¹

2
- 0032631324
- Photothermal FT-IR spectroscopy: A step towards FT-IR microscopy at a resolution better than the diffraction limit
- (1999) Appl. Spectrosc , vol.53 , pp. 810-815
- Hammiche, A.¹

3
- 0346245491
- Chichester: Wiley
- (2002) Handbook of Vibrational Spectroscopy , vol.2 , pp. 1472-1492
- Chalmers, J.M.¹ Griffiths, P.R.²

4
- 0000274050
- (2000) Chem. Phys. Lett , vol.318 , pp. 131-136
- Stockle, R.M.¹

5
- 0032987669
- (1999) J. Microsc , vol.194 , pp. 512
- Knoll, B.¹ Keilmann, F.²

6
- 0005592183
- The use of near-field probes for vibrational spectroscopy and photothermal imaging
- ed J M Chalmers and P R Griffiths (Guildford: Wiley)
- (2002) Handbook of Vibrational Spectroscopy , pp. 1472-1492
- Pollock, H.M.¹ Smith, D.A.²

7
- 0020809765
- Infrared synchrotron radiation from electron storage-rings
- (1983) Appl. Opt , vol.22 , pp. 2914-2923
- Duncan, W.D.¹ Williams, G.P.²

8
- 0005626884
- A new radiation source for the infrared region
- (1984) Nature , vol.312 , pp. 742-744
- Yarwood, J.¹

9
- 0001359601
- Reflection absorption infrared-spectroscopy at the Daresbury SRS
- (1992) Rev. Sci. Instrum , vol.63 , pp. 1547-1550
- Slater, D.A.¹

10
- 0005642843
- Design of an instrument for far-infrared microspectroscopy using a synchrotron radiation source
- (1992) Rev. Sci. Instrum , vol.63 , pp. 1551-1554
- Ugawa, A.¹

11
- 0000807844
- Infrared synchrotron radiation instrumentation and applications
- (1992) Rev. Sci. Instrum , vol.63 , pp. 1535-1538
- Williams, G.P.¹

12
- 85034737946
- (SPIE vol 3153) ed G.P. Williams and P. Dumas
- (1997) Accelerator-Based Infrared Sources and Applications , pp. 51-58
- Carr, G.L.¹ Williams, G.P.²

13
- 0000631886
- Synchrotron infrared microspectroscopy as a means of studying chemical composition at a cellular level
- (1997) Biophys. J , vol.72
- Miller, L.M.¹

14
- 85034770797
- Porquerolles Island, France
- (2001) Int. Workshop on IR Microspectrometry Using Synchrotron Radiation and Free Electron Lasers
- Bozec, L.¹

15
- 0031968232
- Fourier transform infrared microscopy: Some advances in techniques for characterisation and structure-property elucidations of industrial material
- (1998) Analyst , vol.123 , pp. 579-586
- Chalmers, J.M.¹

16
- 85034732545
- School of Chemistry (Nottingham: University of Nottingham)
- (2000) Synchrotron Infrared Microspectroscopy
- Pearson, M.¹

17
- 0031683807
- Generic scanned-probe microscope sensors by combined micromachining and electron-beam lithography
- (1998) J. Vac. Sci. Technol. B , vol.16 , pp. 54-58
- Zhou, H.¹

18
- 0000364793
- Recent progress in the functionalization of atomic force microscope probes using electron-beam nanolithography
- (1999) J. Vac. Sci. Technol. A , vol.17 , pp. 2233-2239
- Zhou, H.¹

19
- 0001048978
- Scanning thermal microscopy using batch fabricated thermocouple probes
- (1998) Appl. Phys. Lett , vol.72 , pp. 2900-2902
- Mills, G.¹

20
- 0024799251
- Optical-absorption microscopy and spectroscopy with nanometer resolution
- (1989) Nature , vol.342 , pp. 783-785
- Weaver, J.M.R.¹ Walpita, L.M.² Wickramasinghe, H.K.³

21
- 0035821102
- Micro-thermal analysis: Techniques and applications
- (2001) J. Phys. D: Appl. Phys , vol.34
- Pollock, H.M.¹ Hammiche, A.²

22
- 0034187332
- Highly localized thermal, mechanical, and spectroscopic characterization of polymers using miniaturized thermal probes
- (2000) J. Vac. Sci. Technol. B , vol.18 , pp. 1322-1332
- Hammiche, A.¹

23
- 0005535503
- New uses for thermal probes
- Oxford, 2002
- (2002) Veeco Instruments Scanning Probe Microscopy Applications Conf
- Hammiche, A.¹

24
- 0033692447
- New adventures in thermal analysis
- (2000) J. Therm. Anal. Calorimetry , vol.60 , pp. 723-733
- Price, D.M.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.