Initial assessment of the effects of radiation on the electrical characteristics of TaOx memristive memories

IEEE Transactions on Nuclear Science

Volumn 59, Issue 6, 2012, Pages 2987-2994

  Marinella, Matthew J ^a   Dalton, Scott M ^a   Mickel, Patrick R ^a   Dodd, Paul E Dodd ^a   Shaneyfelt, Marty R ^a   Bielejec, Edward ^a   Vizkelethy, Gyorgy ^a   Kotula, Paul G ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Nonvolatile memory; radiation effects; redox memory; ReRAM; resistive memory; RRAM; space electronics

Indexed keywords

NON-VOLATILE MEMORIES; RERAM; RESISTIVE MEMORIES; RRAM; SPACE ELECTRONICS;

DEGRADATION; GAMMA RAYS; IRRADIATION; MEMRISTORS; OXYGEN VACANCIES; PASSIVE FILTERS; PROTONS; RADIATION EFFECTS; RESISTORS; SILICON;

RANDOM ACCESS STORAGE;

EID: 84872913996     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2012.2224377     Document Type: Article

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