Atomic-scale chemical analyses of niobium oxide/niobium interfaces via atom-probe tomography

Applied Physics Letters

Volumn 93, Issue 13, 2008, Pages

  Yoon, Kevin E ^a,e   Seidman, David N ^a,b   Antoine, Claire ^c   Bauer, Pierre ^d  

^a Northwestern University   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

^c CEA SACLAY   (France)

^d ITER ORGANIZATION   (France)

^e United States Patent and Trademark Office   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM-PROBE TOMOGRAPHY; INTERNATIONAL LINEAR COLLIDER; NIOBIUM OXIDES; PICO-SECOND LASERS; ROOT MEAN SQUARES; SCALE CHARACTERIZATION; SUPERCONDUCTING RADIO-FREQUENCY;

ATOMIC PHYSICS; CHEMICAL ANALYSIS; DIAGNOSTIC RADIOGRAPHY; MEDICAL IMAGING; NIOBIUM; NIOBIUM COMPOUNDS; SUPERCONDUCTING MATERIALS; TOMOGRAPHY; TRANSITION METALS;

ATOMS;

EID: 53349151533     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2987483     Document Type: Article

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