EELS of Niobium and Stoichiometric Niobium-Oxide Phases—Part II: Quantification

Microscopy and Microanalysis

Volumn 15, Issue 6, 2009, Pages 524-538

  Bach, David ^a   Schneider, Reinhard ^a   Gerthsen, Dagmar ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

accuracy; EELS; k factor; Nb2O5; NbO; NbO2; niobium oxide; precision; quantification

Indexed keywords

EID: 85011477276     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609991061     Document Type: Article

References (31)

1. Ahn C. & Rez P. (1985). Inner shell edge profiles in electron energy loss spectroscopy. Ultramicroscopy 17, 105–116.
2. Auerhammer J., Rez P. & Hofer F. (1989). A comparison of theoretical and experimental L and M cross sections. Ultramicroscopy 30, 365–370.
3. Bach D., Schneider R., Gerthsen D., Verbeeck J. & Sigle W. (2009). EELS of niobium and stoichiometric niobium-oxide phases—Part I: Plasmon and near-edges fine structure. Microsc Microanal 15, 505–523 (this issue).
4. Bach D., Störmer H., Schneider R., Gerthsen D. & Verbeeck J. (2006). EELS investigations of different niobium oxide phases. Microsc Microanal 12, 416–423.
5. Bertoni G. & Verbeeck J. (2008). Accuracy and precision in model based EELS quantification. Ultramicroscopy 108, 782–790.
6. Bruley J., Williams D.B., Cuomo J.J. & Pappas D.P. (1995). Quantitative near-edge structure analysis of diamond-like carbon in the electron microscope using two-window method. J Microsc 180, 22–32.
7. Brydson R. (1991). Interpretation of near-edge structure in the electron energy-loss spectrum. EMSA Bull 21, 57–67.
8. Brydson R. (2001). Electron Energy Loss Spectroscopy. Oxford, UK: BIOS Scientific Publishers Ltd.
9. Egerton R.F. (1978). Formulae for light-element microanalysis by electron energy-loss spectrometry. Ultramicroscopy 3, 243–251.
10. Egerton R.F. (1979). K-shell ionization cross-sections for use in microanalysis. Ultramicroscopy 4, 169–179.
11. Egerton R.F. (1986). Electron Energy-Loss Spectroscopy in the Electron Microscope. New York: Plenum Press.
12. Fix T., Ulhaq-Bouillet C., Colis S., Dinia A., Bertoni G., Verbeeck J. & Van Tendeloo G. (2007). Nanoscale analysis of interfaces in a metal/oxide/oxide trilayer obtained by pulsed laser deposition. Appl Phys Lett 91, 023106.
13. Gmelin. (1970). Gmelin Handbuch der Anorganischen Chemie, Niob, Teil B1. Weinheim, Germany: Verlag Chemie GmbH.
14. Hanada N., Ichikawa T. & Fujii H. (2007). Hydrogen absorption kinetics of the catalyzed MgH2 by niobium oxide. J Alloy Compd 446-447, 67–71.
15. Heusing S., Sun D.L., Otero-Anaya J. & Aegerter M.A. (2006). Grey, brown and blue coloring sol-gel electrochromic devices. Thin Solid Films 502, 240–245.
16. Hofer F. (1991). Determination of inner-shell cross-sections for EELS-quantification. Microsc Microanal Microstruct 2, 215–230.
17. Hofer F. & Golob P. (1988). Quantification of electron energy-loss spectra with K and L shell ionization cross-sections. Micron Microsc Acta 19, 73–86.
18. Hofer F., Golob P. & Brunegger A. (1988). EELS quantification of the elements Sr to W by means of M45 edges. Ultramicroscopy 25, 81–84.
19. Hofer F. & Kothleitner G. (1993). Quantitative microanalysis using electron energy-loss spectroscopy: I. Li and Be in oxides. Microsc Microanal Microstruct 4, 539–560.
20. Hofer F. & Kothleitner G. (1996). Quantitative microanalysis using electron energy-loss spectroscopy: II. Compounds with heavier elements. Microsc Microanal Microstruct 7, 265–277.
21. Hofer F., Kothleitner G. & Rez P. (1996). Ionization cross-sections for the L23-edges of the elements Sr to Mo for quantitative EELS analysis. Ultramicroscopy 63, 239–245.
22. Keast V.J., Scott A.J., Brydson R., Williams D.B. & Bruley J. (2001). Electron energy-loss near-edge structure—A tool for the investigation of electronic structure on the nanometre scale. J Microsc 203, 135–175.
23. Leapman R.D., Rez P. & Mayers D.F. (1980). K, L, and M shell generalized oscillator strengths and ionization cross sections for fast electron collisions. J Chem Phys 72, 1232–1243.
24. Malis T., Cheng S.C. & Egerton R.F. (1988). EELS log-ratio technique for specimen-thickness measurement in the TEM. J Electron Micr Tech 8, 193–200.
25. Malis T. & Titchmarsh J.M. (1986). “k-kactor” approach to EELS analysis. In Electron Microscopy and Analysis 1985, pp. 181–182. Bristol, UK: Institute of Physics.
26. Olszta M.J. & Dickey E.C. (2008). Interface stoichiometry and structure in anodic niobium pentoxide. Microsc Microanal 14, 451–458.
27. Olszta M.J., Wang J. & Dickey E.C. (2006). Stoichiometry and valence measurements of niobium oxides using electron energy-loss spectroscopy. J Microsc 224, 233–241.
28. Qiu Y., Smyth D. & Kimmel J. (2002). The stabilization of niobium-based solid electrolyte capacitors. Active and Passive Electr Comp 25, 201–209.
29. Rez P. (1982). Cross-sections for energy loss spectrometry. Ultramicroscopy 9, 283–288.
30. Rho S., Jahng D., Lim J.H., Choi J., Chang J.H., Lee S.C. & Kim K.J. (2008). Electrochemical DNA biosensors based on thin gold films sputtered on capacitive nanoporous niobium oxide. Biosens Bioelectron 23, 852–856.
31. Sasaki K., Zhang L. & Adzic R.R. (2008). Niobium oxide supported platinum ultra-low amount electrocatalysts for oxygen reduction. Phys Chem Chem Phys 10, 159–167.