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Nanoscale

Volumn 4, Issue 19, 2012, Pages 5835-5839

Porosification-reduced optical trapping of silicon nanostructures

(5) To, Wai Keung a Fu, Junxue a Yang, Xiongbo b Roy, V A L b Huang, Zhifeng a

a HONG KONG BAPTIST UNIVERSITY (Hong Kong)

b CITY UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; MESOPOROUS MATERIALS; NANOWIRES; OPTICAL PROPERTIES;

INNER SURFACES; MESOPOROUS SILICON; METAL-ASSISTED CHEMICAL ETCHING; OPTICAL SCATTERING; OPTICALTRAPPING; POROSIFICATION; SILICON NANO STRUCTURES; SOLID SILICON; TOTAL REFLECTION; WAVELENGTH RANGES;

SILICON;

METAL; NANOMATERIAL; NANOWIRE; POLYMER; SILICON;

ARTICLE; CHEMISTRY; POROSITY; SPECTROPHOTOMETRY;

METALS; NANOSTRUCTURES; NANOWIRES; POLYMERS; POROSITY; SILICON; SPECTROPHOTOMETRY;

EID: 84872864968 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c2nr31680c Document Type: Article

Times cited : (19)

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