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Volumn 112, Issue 12, 2012, Pages

Impact of thermal boundary conductances on power dissipation and electrical breakdown of carbon nanotube network transistors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOSSES; FLEXIBLE ELECTRONICS; MACROS; MOLECULAR DYNAMICS; SEMICONDUCTOR JUNCTIONS; SILICA; SUBSTRATES; THERMAL CONDUCTIVITY; THIN FILM TRANSISTORS;

EID: 84872835155     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4767920     Document Type: Article
Times cited : (13)

References (51)
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    • Ong, Z.-Y.1    Pop, E.2
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    • C. W. Nan, Z. Shi, and Y. Lin, Chem. Phys. Lett. 375, 666 (2003). 10.1016/S0009-2614(03)00956-4
    • (2003) Chem. Phys. Lett. , vol.375 , pp. 666
    • Nan, C.W.1    Shi, Z.2    Lin, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.