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Volumn 233, Issue , 2013, Pages 47-54
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The interface effect on the I-V curves and analysis of ionic diffusion coefficients of polycrystalline CuIn4Te6
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Author keywords
Chalcopyrite; I V relations; Ionic diffusion coefficients; MIEC; Mixed ionic electronic conductor
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Indexed keywords
APPLIED VOLTAGES;
CHALCOPYRITE;
CONSTANT VOLTAGE;
CURRENT INTENSITY;
DISCHARGING PROCESS;
DYNAMIC PROCESS;
ELECTRONIC CURRENT;
ENERGY DISPERSIVE X RAY SPECTROSCOPY;
EQUIVALENT ELECTRICAL CIRCUITS;
EXTERNAL VOLTAGES;
FUNCTION OF TIME;
HYSTERESIS CYCLES;
HYSTERESIS EFFECT;
I - V CURVE;
I-V RELATIONS;
INTERFACE EFFECT;
INTERFACE POTENTIALS;
INTERFACE REGIONS;
IONIC MOTION;
KEY PARAMETERS;
MIEC;
MIXED IONIC AND ELECTRONIC CONDUCTORS;
MIXED-IONIC-ELECTRONIC-CONDUCTOR;
MOBILE IONS;
POLYCRYSTALLINE;
POTENTIAL CHANGE;
RESIDUAL VOLTAGE;
SAMPLE THICKNESS;
VOLTAGE DROP;
COPPER COMPOUNDS;
HYSTERESIS;
X RAY SPECTROSCOPY;
DIFFUSION IN SOLIDS;
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EID: 84872808929
PISSN: 01672738
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ssi.2012.12.016 Document Type: Article |
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Times cited : (3)
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References (26)
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