Semi-conductors with mobile ions show a new type of I-V relations

Journal of Electroceramics

Volumn 14, Issue 3, 2005, Pages 205-212

  Rosenstock, Zvi ^a,b   Feldman, Irena ^a   Gil, Yotam ^a   Riess, Ilan ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b RAFAEL   (Israel)

Author keywords

Cu2O; I V relations; MIEC; Mixed ionic electronic conductor; Schottky barrier; Semi conductor

Indexed keywords

COPPER OXIDES; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; IONS; SCHOTTKY BARRIER DIODES; THERMAL EFFECTS;

CU2O; I-V RELATIONS; MIEC; MIXED-IONIC-ELECTRONIC-CONDUCTOR; MOBILE IONS; SCHOTTKY BARRIERS;

SEMICONDUCTOR MATERIALS;

EID: 17444393982     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10832-005-0959-2     Document Type: Article

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