Effect of thickness on optical properties of thermally evaporated SnS films

Thin Solid Films

Volumn 527, Issue , 2013, Pages 164-169

  Selim, M S ^a   Gouda, M E ^b   El Shaarawy, M G ^b   Salem, A M ^a,c   Abd El Ghany, W A ^a  

^a NATIONAL RESEARCH CENTRE   (Egypt)

^b BENHA UNIVERSITY   (Egypt)

^c UMM AL QURA UNIVERSITY   (Saudi Arabia)

Author keywords

Evaporation; Optical properties; Selenium sulfide; Thin films

Indexed keywords

BAND-GAP VALUES; CHEMICAL COMPOSITIONS; CLEAN GLASS SUBSTRATES; CRYSTALLINE NATURE; DEPOSITED FILMS; OPTICAL ABSORPTION COEFFICIENTS; ROOM TEMPERATURE; SELENIUM SULFIDE; SNS FILMS; TRANSMISSION ELECTRON MICROSCOPE; WAVELENGTH RANGES; X-RAY DIFFRACTION STUDIES;

AMORPHOUS FILMS; CRYSTALLINE MATERIALS; DEPOSITS; EVAPORATION; FILM THICKNESS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SELENIUM; SEMICONDUCTING SELENIUM COMPOUNDS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

TIN;

EID: 84872603995     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.10.019     Document Type: Article

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