Optical properties of tin sulphide (SnS) thin film estimated from transmission spectra

Journal of Non-Crystalline Solids

Volumn 358, Issue 12-13, 2012, Pages 1447-1451

  Abdelrahman, A E ^a   Yunus, W M M ^b   Arof, A K ^a  

^a UNIVERSITY OF MALAYA   (Malaysia)

^b UNIVERSITY PUTRA MALAYSIA   (Malaysia)

Author keywords

Energy band gap; Refractive index; Thin films; Transmission spectrum; X ray diffraction

Indexed keywords

CONDUCTING GLASS; ENERGY DEPENDENCE; SNS FILMS; SNS THIN FILMS; THERMAL EVAPORATION TECHNIQUE; TIN SULPHIDE; TRANSMISSION SPECTRUMS; WAVELENGTH RANGES;

BAND STRUCTURE; ENERGY GAP; SUBSTRATES; THERMAL EVAPORATION; THIN FILMS; TIN; TIN OXIDES; WAVELENGTH; X RAY DIFFRACTION;

REFRACTIVE INDEX;

EID: 84861861963     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2012.03.022     Document Type: Article

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