Structural characterization and novel optical properties of defect chalcopyrite ZnGa2Te4 thin films

Materials Research Bulletin

Volumn 46, Issue 11, 2011, Pages 2141-2146

  Fouad, S S ^a   Sakr, G B ^a   Yahia, I S ^a   Basset, D M Abdel ^a  

^a Ain Shams University   (Egypt)

Author keywords

A. Amorphous materials; A. Thin films; C. X ray diffraction; D. Crystal structure; D. Optical properties

Indexed keywords

ABSORBING LAYERS; ABSORPTION REGION; ANNEALING TEMPERATURES; AS-DEPOSITED FILMS; BULK MATERIALS; CHEMICAL COMPOSITIONS; CLEANED GLASS SUBSTRATES; ELECTRON DIFFRACTION STUDY; ENERGY DISPERSIVE X-RAY; NORMAL INCIDENCE; OPTICAL ABSORPTION COEFFICIENTS; OSCILLATOR PARAMETERS; POLYCRYSTALLINE; REFRACTIVE INDEX DISPERSION; SINGLE-OSCILLATOR MODEL; SPECTRAL RANGE; STRUCTURAL CHARACTERIZATION; THERMAL EVAPORATION TECHNIQUE; X-RAY DIFFRACTION TECHNIQUES;

AMORPHOUS MATERIALS; ANNEALING; COPPER COMPOUNDS; CRYSTAL STRUCTURE; DEFECTS; DISPERSION (WAVES); REFRACTIVE INDEX; SUBSTRATES; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION;

FILM PREPARATION;

EID: 80052836677     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2011.06.002     Document Type: Article

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