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Volumn 526, Issue , 2012, Pages 103-108

Structural and optoelectronic properties of p-type semiconductor CuAlO 2 thin films

Author keywords

Copper aluminum oxide; Optoelectronic properties; Semiconductor; Sputtering; Structure; Transmission electron microscopy; X ray diffraction

Indexed keywords

ALUMINUM OXIDES; DIRECT BAND GAP; ELECTRICAL RESISTIVITY; GRAIN SIZE; HIGH-TEMPERATURE ANNEALING; HOLDING TIME; MAGNETRON-SPUTTERING DEPOSITION; OPTOELECTRONIC PROPERTIES; OXYGEN ATOM; P TYPE SEMICONDUCTOR; P-TYPE; PHASE CHANGE; QUARTZ SUBSTRATE; ROOT MEAN SQUARE ROUGHNESS;

EID: 84872162325     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.11.033     Document Type: Article
Times cited : (22)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.