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Volumn 44, Issue 1, 2013, Pages 125-130

Retardation of the Cu5Zn8 phase fracture and improvement of shear strength of the Sn-9 wt pct Zn/Cu interface by inserting an electroless palladium layer

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC INTERDIFFUSION; ELECTROLESS; INTERFACIAL INTERMETALLICS; INTERMETALLIC COMPOUND GROWTHS; JOINT INTERFACES; MECHANICAL TESTS; MICROSTRUCTURAL STABILITY; PALLADIUM LAYERS; SN-9ZN SOLDER; SOLID-STATE AGING; UNIFORM LAYER;

EID: 84872004683     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-012-1377-0     Document Type: Article
Times cited : (6)

References (13)
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  • 12
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    • 10.1016/j.scriptamat.2010.12.006 1:CAS:528:DC%2BC3MXht1Whs7o%3D
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    • Chou, C.Y.1    Chen, S.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.