Optical-field-induced current in dielectrics

Nature

Volumn 493, Issue 7430, 2013, Pages 70-74

  Schiffrin, Agustin ^a,f   Paasch Colberg, Tim ^a   Karpowicz, Nicholas ^a   Apalkov, Vadym ^b   Gerster, Daniel ^c   Mühlbrandt, Sascha ^a,c   Korbman, Michael ^a   Reichert, Joachim ^c   Schultze, Martin ^a,d   Holzner, Simon ^a   Barth, Johannes V ^c   Kienberger, Reinhard ^a,c   Ernstorfer, Ralph ^a,c,e   Yakovlev, Vladislav S ^a,d   Stockman, Mark I ^b   Krausz, Ferenc ^a,d  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^b GEORGIA STATE UNIVERSITY   (United States)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^d UNIVERSITY OF MUNICH   (Germany)

^e FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^f UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

DIELECTRIC PROPERTY; ELECTRIC FIELD; ELECTRICAL CONDUCTIVITY; SEMICONDUCTOR INDUSTRY; SIGNAL PROCESSING; SILICA; SILICON;

ARTICLE; DIELECTRIC CONSTANT; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT; ELECTRIC FIELD; ELECTRICAL PARAMETERS; FIELD EFFECT TRANSISTOR; OPTICS; PRIORITY JOURNAL; SEMICONDUCTOR; ULTRAVIOLET RADIATION;

EID: 84871810333     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature11567     Document Type: Article

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